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Item
Effect of VNA measurement uncertainty on Q-factor determination of resonant structures for permittivity measurements
https://aist.repo.nii.ac.jp/records/2002038
https://aist.repo.nii.ac.jp/records/2002038b57a909c-3991-4843-9ffe-50ab02695f31
| Item type | Research Data (v9)(1) | |||||||||
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| PubDate | 2014-01-01 | |||||||||
| Data name | ||||||||||
| Title | Effect of VNA measurement uncertainty on Q-factor determination of resonant structures for permittivity measurements | |||||||||
| Language | en | |||||||||
| Description of data | ||||||||||
| Description Type | Abstract | |||||||||
| Description | We have evaluated the effect of VNA measurement uncertainty on the Q-factor determination of resonant structures by using Monte Carlo calculations. In contrast to the previous study, correlations between measured S-parameters at each frequency are rigorously taken into account, which is important because the Q-factor is derived from the frequency dependence of the S-parameter. We directly connect the uncertainty of S-parameters to the incompleteness of a line standard used for the TRL calibration. | |||||||||
| Language | en | |||||||||
| Author (Creator) name |
加藤 悠人
× 加藤 悠人
× 堀部 雅弘
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| Access Rights | ||||||||||
| Access Rights | open access | |||||||||
| Access Rights URI | http://purl.org/coar/access_right/c_abf2 | |||||||||
| APC | ||||||||||
| APC | Not required | |||||||||
| Rights Holder | ||||||||||
| Right Holder Name | 加藤 悠人 | |||||||||
| Language | en | |||||||||
| Publisher | ||||||||||
| Publisher | 電子情報通信学会 | |||||||||
| Language | en | |||||||||
| Date | ||||||||||
| Date | 2014-01-01 | |||||||||
| Date Type | Issued | |||||||||
| Language | ||||||||||
| Language | eng | |||||||||
| Resource Type | ||||||||||
| Resource Type Identifier | http://purl.org/coar/resource_type/c_6501 | |||||||||
| Resource Type | journal article | |||||||||
| Source Title | ||||||||||
| Source Title | Proceedings of Thailand-Japan MicroWave 2014 | |||||||||
| Language | en | |||||||||
